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Course Description

This program covers a broad range of topics. Understand the foundational mechanisms and terminology associated with various types of radiation effects in electronic devices, the preparation of single event data for reliability estimation, CREME 96, radiation induced failures of semiconductor power devices, radiation enabled modeling and simulation, single event response and testing, the natural space radiation environment, and spacecraft charging.

 

Please reach out to vuse.strategicpartnerships@vanderbilt.edu with any questions.

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Section Title
Radiation Effects in Electronics
Section Schedule
Jan 01, 2025 to Dec 31, 2026
Course Fee(s)
Fee non-credit $3,000.00
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